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AUDIO_DESIGN Document

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说明:  共3分文档: 18+bit+Sigma+Delta+DAC的设计.pdf 数字插值滤波器的设计-大学本科毕业设计.pdf 数字麦克风原理与应用.pdf(18+bit+Sigma+Delta+DAC Design.pdf digital interpolation filter digital microphone theroy)

文件列表:

数字麦克风原理与应用.pdf, 1680126 , 2016-12-09
18%2Bbit%2BSigma%2BDelta%2BDAC的设计.pdf, 3033809 , 2015-12-14
数字插值滤波器的设计-大学本科毕业设计.pdf, 1965284 , 2016-07-27

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  • Rohde&Schwarz 频谱仪操作手册(英文)
    Rohde&Schwarz 频谱仪操作手册(英文) 1145.5850系列全英文,详细的操作方式,各类使用技巧R&S FSHContentsContentsSpecificationsSafety InstructionsCertificate of qualitEC-Certificate of conformitySupport Center AddressList of R&S RepresentativesPutting into OperationFront view1.1Putting into Operation1.2Unpacking the Instrument1.2Setting up the InstrumentSwitching on the Spectrum Analyzer1.4Spectrum Analyzer Connectors1.5Screen SettingsQCountry-Specific Settings1.10Setting the Date and TimeSetting the date.1.11Setting the time1.1Charging the Battery......1.12Selecting the Instrument Default Setup1.13External Reference /External Trigger Switchover1.14Controlling the rF Attenuator1.15Using a Preamplifier…1.15PIN Entr1.17Connecting Printers.1.19Setting the Baud rate for Remote Control1.21Enabling Options1.21Checking the Installed options1.221145.5973.12E-15ContentsR&S FSH2 Getting Started2.Measurements on cw signals2.1Level measurement2Setting the Reference Level量‘面2.2Frequency Measurements2.3Harmonic Measurements of a sinewave Signal面面2.4Power Measurements Using the Power Sensor2.5Power and return loss measurements with the r&s FsH-z14 or the r&s FSH-Z444427Two-Port Transmission measurements2.9Measurement of return loss2.11Performing Distance-To-Fault Measurements...2.14Operation in Receiver Mode2.20Measuring the carrier-to-Noise power ratio2.Determining the Reference2.26Sts…2.26Selecting the reference channel2.27Entering the channel bandwidth of the reference channel2.27Selecting the unit for the reference...2.27Manually entering the reference2.27Automatic level adjustment2.27Measuring the Noise Power and Calculating Carrier Power /Noise Power.........2.28Selecting the result display2.28Frequency setting of the noise channel..2.28Setting the noise channel measurement bandwidth2.29Setting the C/N channel bandwidth2.29Automatic level adjustment2.29Correcting the displayed average noise level2.30Hiding the result display2.30Saving and Recalling Settings and Test Results2.31Saving Measurement Results2.31Saving Calibration Data2.32Recalling measurement results2.33Printing Out Measurement Results……2.341145.5973.122E-15R&S FSHContents3 Operation3.Screen LayoutScreen layout for spectrum-mode measurements without markers3.1Screen layout when the marker mode is selected3.2Entering Measurement ParametersEntering values and texts3.3Entering units3.4Menu overview.3.5Frequency entryFrequency span...Level setting…3.5Bandwidth settingTrace setting3.6Measurement functions3.7Marke3.10Save and print menu3.12Instrument setup3.12Status display3.12Menus in the Receiver Mode(option R&S FSH-K3)3.13Menu for 3GPP BTS Code domain Power Measurement (Option R&S FSH-K4)3.16Menu for Vector Voltmeter(Option R&S FSH-K2)3.161145.5973.12E-15ContentsR&S FSH4 Instrument functions4Instrument Default Setup4.1Status Display..................4.1Setting the Frequency4.2Entering the center frequency..4.2Setting a frequency offset4.2Entering the center-frequency step size4.3Entering the start and stop frequency4.4Working with channel tablesSetting the Span1面4.6Setting the Amplitude Parameters4.7Setting the reference levelEntering the display range94.9Entering the display unit4.9Entering the reference offset4.10Entering the input impedance.…………4.10Setting the Bandwidths4.11Resolution bandwidth4.11Video bandwidth4.13Setting the Sweep4.14Sweep time.4.15Sweep mode.4.15Trigger4.16Trace Settings4.19Trace mode∴4.19Detector4.20Trace memory…4.22Trace mathematics4.23Using the Markers4.24Automatic marker positioning .......4.25Using more than one marker at a time(multimarker mode).........,4.27Marker functions4.30Measuring the noise power density4.30Measuring the frequency4.31Measuring the filter bandwidth or the signal bandwidth4.32aF demodulation4.331145.5973.12E-15R&S FSHContentsUsing the dis play line…….….….….….….….….….…..….….……….…..34Setting and Using the Measurement Functions4.35Measuring the channel power of continuously modulated signals………………4.35Selecting the standard4.36Setting the reference level4.38Setting the channel bandwidth4.38Changing the spaPower displaPower measurements on TDMA signals4.42Selecting a standard∴4.42Setting the measurement time4.44Optimizing the reference level ..4.44Power readout4.45Setting the trigger4.45Measuring the occupied bandwidth4.46Selecting a standard4.47Setting the reference level4.48Setting the channel bandwidth4.49Entering the power percent to determine the occupied bandwidth4.50Displaying thupied bandwidth4.50Changing the spai1145.5973.12E-15ContentsR&S FSHMeasuring the Carrier-to-Noise Ratio.......4.52Determining the reference4.53Setting the reference channel4.53Setting the reference channel bandwidth……4.53Setting the analyzer reference level for the reference channel measurement4.54Manual reference mode4.54Inserting the c/N referenceUnits of the c/n reference4.55StandardsUSER Standard4.56User-specific standards4.56Predefined user-specific standards4.59Predefined user-specific standard Digital TX4.59Predefined user-specific standard ANalog tv mode4.60Predefined user-specific standard ctx4.60Measuring the noise channel power and calculating the carrier power/noise power.4.62Frequency setting of the noise channel………4.63Setting the noise channel bandwidth4.64Setting the C/N ratio channel bandwidth4.64Setting the reference level during noise channel measurement.4.65Selecting the c/ N result display..…,…4.65C/N measurement result display4.66Changing the span4.66Correction of inherent noise power4.67Using the R&S FSH in receiver mode4.68Setting the frequencySetting the reference level,,,。.。4.71Setting the bandwidth4.72Setting the detector4.73Setting the measurement time4.73Measurement on multiple frequencies or channels(scan)4.74Measurements using the power sensor4.76Connecting the power sensor……4.76Zeroing the power sensor.4.78Selecting the unit for the power readout4.79Setting the averaging time.……4.80Taking additional loss or gain into account4.81Measuring forward and reflected power∴4.82Zeroing the power sensor4.84Setting the power measurement weighting4.85Selecting the unit for the power readout4.86Taking additional attenuation into account4.881145.5973.126E-15R&S FSHContentsTwo-port measurements with the tracking generator489Measuring the transmission of two-ports4.91Vector transmission measurement494Measuring the transmission magnitude........4.96Measuring the transmission phase4.96Measuring the electrical length when measuring transmission面B国4.99Measuring the group delay when measuring transmission4.100Transmission measurement using the connected VSWR Bridge R&S FSH-Z3.. 4.102Sppectrum measurements with the VsWR Bridge R&s FSH-Z3 or R&S FSH-Z2connectedSetting for detecting the R&S FSH-Z3 in the transm. and spectr. measurement .. 4.104Supplying DC voltage to active DUTs4.105Reflection measurements4.105Scalar measurement of reflection4.106Vector measurement of reflection4.108Measuring the reflection magnitude4.111Measuring the reflection phase.……4.111Measuring the electrical length 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Factors.4.153Unit for measurements with transducers4.156Reference level settings for measurements with transducers4.156Frequency range of transducer………4.156Data sets containing transducer factors4.156Field-Strength Measurement with Isotropic Antenna∴4.157Connecting the antenna to the R&S FSH4.157Measurement of the resultant field strength in a transm. channel with large bandwidth .......4.159Code Domain Power Measurement on 3GPP FDD Signals.4.166Saving and Loading Instrument Settings and Measurement Results4.173Saving results4.174Entering a data set name4.175Loading measurement results.4.175Deleting saved data sets4.176Deleting all data sets4.177Printing out Measurement Results4.178Measurements4.179How a spectrum analyzer operates…4.1791145.5973.12E-15
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  • Verilog-IEEE Std 1364 -2005 IEEE Standard
    Verilog的IEEE标准,比较新的一个吧应该是IEEE Std 1364 TM-2005(Revision of IEEE Std 1364-2001)lEE Standard for VerilogHardware Description LanguageSponsorDesign Automation Standards Committeeof theIEEE Computer SocietyAbstract: The Verilog hardware description language(HDL) is defined in this standard. VerilogHDL is a formal notation intended for use in all phases of the creation of electronic systems. Because it is both machine-readable and human-readable, it supports the development, verificationsynthesis, and testing of hardware designs; the communication of hardware design data; and themaintenance, modification, and procurement of hardware. The primary audiences for this standardare the implementors of tools supporting the language and advanced users of the languageKeywords: computer, computer languages, digital systems, electronic systems, hardware, hardware description languages, hardware design, HDL, PLI, programming language interface, Verilog,Verilog HDL, verilog PllThe Institute of Electrical and Electronics Engineers, Inc3 Park Avenue. New york. NY 10016-5997 USACopyright@ 2006 by the Institute of Electrical and Electronics Engineers, IncAll rights reserved Published 7 April 2006. Printed in the United states of AmericaIEEE is a registered trademark in the U.S. Patent Trademark Office, owned by the Institute of Electrical and ElectronicsEngineers, IncorporatedVerilog is a registered trademark of Cadence Design Systems, IncPrint:|sBN0-738148504SH95395PDFSBN0-7381-48512SS95395No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisher.IEEE Standards documents are developed within the IEee Societies and the Standards CoordinatingCommittees of the iEEE Standards Association (IEEE-SA)Standards board The ieee develops its standardsthrough a consensus development process, approved by the american National Standards Institute, which bringstogether volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are notnecessarily members of the Institute and serve without compensation. While the ieee administers the processand establishes rules to promote fairness in the consensus development process, the ieee does not independentlyevaluate, test, or verify the accuracy of any of the information contained in its standards.Use of an IEEE Standard is wholly voluntary. The ieee disclaims liability for any personal injury, property orother damage of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly orindirectly resulting from the publication, use of, or reliance upon this, or any other iEEE Standard documentThe ieee does not warrant or represent the accuracy or content of the material contained herein, and expresslydisclaims any express or implied warranTy, including any implied warranty of merchantability or fitness for a specific purpose, or that the use of the material contained herein is free from patent infringement. IEEE Standardsdocuments are supplied "AS IsThe existence of an IEEE Standard does not imply that there are no other ways to produce, test, measurepurchase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, theviewpoint expressed at the time a standard is approved and issued is subject to change brought about throughdevelopments in the state of the art and comments received from users of the standard Every IeeE Standard issubjected to review at least every five years for revision or reaffirmation. When a document is more than fiveyears old and has not been reaffirmed, it is reasonable to conclude Chat ils contents, although still of some valuedo not wholly reflect the present state of the art. Users are cautioned to check to determine that they have thelatest edition of any IEEE StandardIn publishing and making this document available, the IEeE is not suggesting or rendering professional or otherervices for, or on behalf of, any person or entity. Nor is the Ieee undertaking to perform any dutyother person or entity to another. Any person utilizing this, and any other ieee Standards document, should relupon the advice of a competent professional in determining the exercise of reasonable care in any givencircumstancesInterpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate tospecific applications. When the need for interpretations is brought to the attention of IEEe, the Institute will initiateaction to prepare appropriate responses. Since ifff Standards represent a consensus of concerned interests, it isimportant to ensure that any interpretation has also received the concurrence of a balance of interests. For thisreason, IEEE and the members of its societies and standards coordinating committees are not able to provide aninstant response to interpretation requests except in those cases where the matter has previously received formalconsideration. At lectures, symposia, seminars, or educational courses, an individual presenting information onIEee standards shall make it clear that his or her views should be considered the personal views of that individuarather than the formal position, explanation, or interpretation of the IeeeComments for revision of IEEE Standards are welcome from any interested party, regardless of membership aftil-iation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of texttogether with appropriate supporting comments Comments on standards and requests for interpretations shouldaddressed toIEEE-SA Standards Board445 Hoes lanePiscataway, NJ 08854USANoTE-Attention is called to the possibility that implementation of this standard may require use of subjectmatter covered by patent rights. By publication of this standard, no position is taken with respect to theexistence or validity of any patent rights in connection therewith. The IEf shall not be responsible foridentifying patents for which a license may be required by an ieee standard or for conducting inquiries into thelegal validity or scope of those patents that are brought to its attentionAuthorization to photocopy portions of any individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc, provided that the appropriate fee is paid to Copyright ClearanceCenter. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service222 Rosewood Drive, Danvers, MA01923 USA; +19787508400. Permission to photocopy portions of any indi-idual standard for educational classroom use can also be obtained through the Copyright Clearance CenterIntroductionThis introduction is not a part of IEEE Std 1364-2005, IEEE Standard for Verilog Hardware Description LanguageThe Verilog hardware description language(HDL) became an IEEE standard in 1995 as IEEE Std 13641995. It was designed to be simple, intuitive, and effective at multiple levels of abstraction in a standardtextual format for a variety of design tools, including verification simulation, timing analysis, test analysisand synthesis. It is because of these rich features that verilog has been accepted to be the language of choiceby an overwhelming number of integrated circuit(IC)designersVerilog contains a rich set of built-in primitives, including logic gates, user-definable primitives, switches,and wired logic. It also has device pin-to-pin delays and timing checks. The mixing of abstract levels isessentially provided by the semantics of two data types: nets and variables. Continuous assignments, inwhich expressions of both variables and nets can continuously drive values onto nets, provide the basicstructural construct. Procedural assignments, in which the results of calculations involving variable and netvalues can be stored into variables, provide the basic behavioral construct. a design consists of a set of modules, each of which has an input/output(1/O)interface, and a description of its function, which can be structural, behavioral, or a mix. These modules are formed into a hierarchy and are interconnected with netsThe Verilog language is extensible via the programming language interface(PLI)and the verilog procedural interface(VPi) routines. The Pli/vPi is a collection of routines that allows foreign functions to accessinformation contained in a Verilog hdl description of the design and facilitates dynamic interaction withsimulation. Applications of PLI/VPI include connecting to a Verilog HDL simulator with other simulationand computer-assisted design(CAD)systems, customized debugging TaskS, delay calculators, andannotatorsThe language that influenced Verilog HDL the most was HILO-2, which was developed at Brunel University in England under a contract to produce a test generation system for the British Ministry of DefensehiLO-2 successfully combined the gate and register transfer levels of abstraction and supported verificationsimulation, timing analysis, fault simulation, and test generationIn 1990, Cadence Design Systems placed the Verilog HDL into the public domain and the independentOpen Verilog International(oVi)was formed to manage and promote Verilog HDL. In 1992, the Board ofDirectors of ovi began an effort to establish Verilog hdl as an ieeE standard. In 1993, the first IEeEworking group was formed; and after 18 months of focused efforts, Verilog became an IEEE standard asIEEE Std 1364-1995After the standardization process was complete, the IEEe P1364 Working Group started looking for feedback from IEEE 1364 users worldwide so the standard could be enhanced and modified accordingly. Thisled to a five-year effort to get a much better Verilog standard in IEEE Std 1364-2001With the completion of IEEE Std 1364-2001, work continued in the larger Verilog community to identifyoutstanding issues with the language as well as ideas for possible enhancements. As Accellera began work-ing on standardizing System Verilog in 2001, additional issues were identified that could possibly have led toincompatibilities between Verilog 1364 and System Verilog. The IEEE P1364 Working group was established as a subcomittee of the System Verilog P1800 Working Group to help ensure consistent resolution ofsuch issues. The result of this collaborative work is this standard ieee Std 1364-2005Copyright C 2006 IEEE. All rights reservedNotice to usersErrataErrata,ifanyforthisandallotherstandardscanbeaccessedatthefollowingurL:http:/stan-dards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errataperiodicaInterpretationsCurrentinterpretationscanbeaccessedatthefollowingUrl:http:/standards.ieeeorg/reading/ieee/interp/Index. htmlPatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEee shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attentionParticipantsAt the time this standard was completed, the ieee P1364 Working group had the following membershipJohny Srouji, IBM, IEEE SyStem verilog Working Group chairTom Fitzpatrick, Mentor Graphics Corporation, ChairNeil Korpusik, Sun Microsystems, Inc, Co-chairStuart sutherland sutherland hdl inc. editorShalom Bresticker, Intel Corporation, Editor through February 2005The Errata Task Force had the following membershipKaren pynopsys,rKurt baty. WFSDB ConsultinDennis marsa. XilinxStefen Boyd, Boyd TechnologyFrancoise Martinolle, Cadence Design Systems, IncShalom Bresticker, Intel CorporationMike McNamara, Verisity, LtdDennis Brophy, Mentor Graphics CorporationDon Mills, LCDM EngineeringCliff Cummings, Sunburst Design, IncAnders nordstrom, Cadence Design Systems, IncCharles dawson, Cadence Design Systems, IncKaren Pieper, Synopsys, IncTom Fitzpatrick, Mentor Graphics CorpoBrad Pierce, Synopsys, IncRonald goodstein, first shot Logic simulation andSteven Sharp Cadence Design Systems, IncAlec Stanculescu. Fintronic USA IncDesignStuart Sutherland. Sutherland HDL IncMark Hartog, Synopsys incGordon Vreugdenhil, Mentor Graphics CorporationJames Markevitch, Evergreen Technology GroupJason Woolf, Cadence design Systems, IncCopyright C 2006 IEEE. All rights reservedThe behavioral Task Force had the following membership:Steven Sharp, Cadence Design Systems, InC, ChairKurt Baty, WFSDB ConsultingJay lawrence. Cadence design Systems. IncStefen Boyd, Boyd TechnologyFrancoise Martinolle, Cadence Design Systems, IncShalom Bresticker, Intel CorporationKathryn McKinley, Cadence Design Systems, IncDennis brophy, Mentor graphics corporationMichael mcnamara. Verisity LtdCliff Cummings, Sunburst Design, IncDon Mills, LCDM EngineeringSteven Dovich, Cadence Design Systems, IncMehdi Mohtashemi, Synopsys, IncTom Fitzpatrick, Mentor Graphics CorporationKaren Pieper, Synopsys, IncRonald Goodstein, First Shot Logic Simulation andBrad Pierce, Synopsys, IncDesignDave Rich, Mentor Graphics CorporationKeith Gover, Mentor Graphics CorporationSteven Sharp, Cadence Design Systems, IncMark Hartoog, Synopsys, IncAlec Stanculescu. Fintronic USAEnnis Hawk, Jeda TechnologiesStuart Sutherland. Sutherland hdl. IncAtsushi kasuya, Jcda TechnologicsGordon Vrcugdcnhil, Mentor Graphics CorporationThe PLI Task Force had the following membershipCharles Dawson, Cadence Design Systems, Inc, ChairGhassan Khoory, Synopsys, Inc Co-chairTapati Basu, Synopsys, IncMichael rohleder. Freescale Semiconductor. IncSteven Dovich, Cadence Design Systems, IncRob Slater, Freescale Semiconductor IncRalph duncan, Mentor Graphics CorporationJohn Stickley, Mentor Graphics CorporationJim garnett, Mentor Graphics CorporationStuart Sutherland. Sutherland HDL. incJoao geada CLK Design AutomationBassam Tabbara. Novas software. IncAndrzej litwiniuk, Synopsys, IncJim Vellenga, Cadence Design Systems, IncFrancoise Martinolle, Cadence Design Systems, IncDoug Warmke, Mentor Graphics CorporationSachchidananda Patel, Synopsys, IncIn addition, the working group wishes to recognize the substantial efforts of past contributorsMichael McNamara, Cadence Design Systems, Inc1364 Working Group past chair(through September 2004)Alec Stanculescu, Fintronic USA, 1304 Working Group past vice-chair(through June 2004)Stefen Boyd, Boyd Technology, ETF past co-chair(through November 2004)The following members of the entity balloting commitlee voted on this standard. Balloters may have votedfor approval, disapproval, or abstentionAccelleraIntel CorporationBluespec, Inc.Mentor Graphics CorporationCadence Dcsign Systcms, IncSun microsystems, IncIntronic u.s.aSunburst design, IncIBMSutherland hdl lncInfineon TechnologiesSynopsys, IncCopyright C 2006 IEEE. All rights reservedWhen the IEEE-SA Standards Board approved this standard on 8 November 2005, it had the followingmembershipSteve M. mills. chairRichard h. hulett vice chairDon wright Past chairJudith gorman. secretaryMark d. bowmanWilliam B HopfT W. olsenDennis B. BrophyLowell G. JohnsonGlenn parsonsJoseph brudeHerman KochRonald c. petersenRichard coxJoseph L. Koepfinger*Gary s. RobinsonBob davisDavid J lawFrank stoneJulian forster kDaleep c mohlaMalcolm v thadenJoanna n. gueninPaul nikolichRichard l. townsendS. HalpJoe d. watseRaymond hapemanHoward L, wolfmanAlso included are the following nonvoting Ieee-Sa Standards board liaisonsSatish K. aval, NRC RepresentativeRichard Deblasio, DOE RepresentativeAlan H. Cookson, NIST RepresentativeMichelle d, trIEEE Standards Project EditoCopyright C 2006 IEEE. All rights reservedContentsOverview1. 2 Conventions used in this standard1.3SIption1 4 Use of color in this standard1.5 Contents of this standard1.6 Deprecated clauses……….….….….…1.7 Header file listings....18 Examples…………………1.9PNormative references63. Lexical conventions83.1 Lexical tokens3.2 White space3. 3 Comments中··…·········:···············中·····“:·:·:·4·····“··········3. 4 Operators3. 5 Numberssteger constants3.5.2 Real constants123.5.3 Conversion123.6 Strings123.6. 1 String variable declaration133.6.2 String manipulation133.6.3 Special cha3.7 Identifiers. keds, and syste143.7.1 Escaped identifiers143.7.2 Keywords153.7.3 System tasks and functions3.7.4 Compiler directives153.8 Attrib163.8.1 Examples3.8.2 SyIata typ··4.1 Val214.2 Nets and variables4.2.1 Net declarations4.2.2 Variable declarations4.3V4.3.1g v244.3.2 Veclor net accessibility44.4 Strengths4.4.1 Charge strength4.4.2 Drive strength.....卓········中····“·········:·····················:········254.5 Implicit declarations4.6 Net types………264.6.1 Wire and tri nets264.6.2 Wired nets4.6.3TCopyright C 2006 IEEE. All rights reserved4.6.4 Trio and tri l nets4.6.5 Unresolved nets4.6.6 Supply nets324.7 Regs324.8 Integers, reals, times, and realtime4.8.1 Operators and real numbers4.8.2 Conversion4.9 Arrays4.9.1Net arrays…·中·····:··344.9.2 reg and variable arrays344.9.3 Memories4.10 Parameters…………………354.10.1 Module parameters…364.10.2 Local parameters(localparam““374.10.3 Specify parameters……384. Name spaces…39Expressions……5.1 Operators41Operators with real operands425.1.2 Operator precedence………5.1.3 Using integer numbers in expressions…….445.1.4 Expression evaluation order……2451. 5 Arithmetic operators5.1.6 Arithmetic expressions with regs and integers5. 1.7 Relational operators485.1.8Equ495.1.9 Logical operators…495.1.10 bitw isators505.1.11 Reduction operators5.112 Shift operators…….535. 1. 13 Conditional operator535.1. 14 Concatenations545.2 Operands………5.2. 1 Vector bit-Select and part-select addressing..565.2.2 Array and memory addressing.......,.……5.2.3ings585.3 Minimum, typical, and maximum delay expressions5.4 Expression bit lengths5.4.1 Rules for expression bit lengths65.4.2 Examole of expression bit-length problerpl635.4.3 Example of self-determined expressions.645.5 Signed expressions5.5.1 Rules for expression types.....5.5.2 Steps for evaluating5.5.3 Steps for evaluating an assignment5.54 Handling X and Z in signed expressions………5.6 Assignments and truncation6. Assignments……………686.1 Continuous assignments686. 1. 1 The net declaration assignment6.1.2 The continuous assignment statement·····中···:·:·4·中·····6.1.371Copyright C 2006 IEEE. All rights reserved
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