A great document about SOm and LVQ

一篇介绍mimo ofdm的文章，对可能涉及到的物理层关键技术做了总结。-introduced a mimo ofdm articles that might relate to the physical layer key technology is summarized.

对现在编程语言的一个综述，总结各编程语言的异同-Present a synthesis programming language to sum up the similarities and differences between the various programming languages

物联网发展纲要，详细介绍物联网的发展情况，应用等-Outline for the Development of things in detail the development of complex network, application, etc.

image processing for transmission micrscopy. Using ray casting and visual effect for dectecttion and unpaint

对混沌时间序列相空间重构中最佳延迟时间间隔和嵌入维数的选取方法作 了综述,提出了同时考虑这2 个参数选取的重构展开虚假邻点法以及预测误差最小-Of chaotic time series phase space reconstruction of the best delay time interval and the embedding dimension of the selection methods were reviewed and put forward these two parameters taking into account the reconstruction of the selected start-point method of false neighbors, as well as the minimum prediction error

现代先进微处理器有非常高的集成度和复杂度，又有寄存器堆、Cache等嵌入式部件，而且芯片管脚数相对较少，必须要有一定的自测试设计和其它的可测试性设计来简化测试代码，提高故障覆盖率。本文简要讨论NRS4000微处理器芯片的以边界扫描测试为主体，以自测试为补充的可测试性设计框架。着重介绍芯片的边界扫描设计和芯片中译码控制器PLA和微程序ＲＯＭ以及采用内嵌RAM结构的指令Cache和寄存器堆的内建自测试设计。仿真结果表明，这些可测试性设计大大缩短了测试代码的长度。-modern microprocessors have a very high degree of integration and complexity, there Register pile, Cache such as embedded components, but Chip few relatively small, There must be the self-test design and testing of other design code to simplify testing, fault coverage. This paper briefly discussed Key words microprocessor chip to the boundary-scan test as the mainstay, Since the test to add to the test design framework. Highlighting the boundary-scan chip design and chip decoder PLA and micro-controller procedures and the use of embedded ROM RA M structure of the instruction cache and register stack of built-in self-test design. The simulation results show that these tests can greatly shorten the design of the test code length.

【海尔-电通企划全案】，从大型企业的发展中学习经验-[Haier- Dentsu case] planning, from the large-scale enterprise development in the learning experience

LM3445 Off-Line TRIAC Dimmer LED Driver Reference Design

Micron MI2020 mt9d112 soc2020 devguide.book.