-
《IT服务管理:概念、理解与实施》
我国首部IT服务管理(ITSM)领域的专著,该书为国内企业驾驭IT服务管理提供了重要的参考资料...
《IT服务管理:概念、理解与实施》
我国首部IT服务管理(ITSM)领域的专著,该书为国内企业驾驭IT服务管理提供了重要的参考资料-"IT service management : the concept, understanding and implementation of" China"s first IT service management (ITSM) is dedicated to the field, the book for domestic enterprises to control IT service management provides an important reference
- 2022-01-26 02:07:24下载
- 积分:1
-
TI DSP application notes
TI DSP application notes
- 2023-05-10 13:50:04下载
- 积分:1
-
我国电力大系统灾变防治和经济运行重大科学问题的研究
我国电力大系统灾变防治和经济运行重大科学问题的研究-China"s largest electricity system collapse prevention and economic operation of the major scientific research
- 2022-01-25 18:23:46下载
- 积分:1
-
还是一篇介绍mimo的经典文章。推荐给入门者
还是一篇介绍mimo的经典文章。推荐给入门者-introduced mimo or a classic article. Recommend it to beginners
- 2023-05-01 08:05:03下载
- 积分:1
-
sst39vf1601数据表
SST39VF1601 datasheet
- 2023-06-25 17:55:03下载
- 积分:1
-
IEEE1394相关,门是1394的首选!强烈推荐。
IEEE1394的相关介绍,是1394入门的首选!强烈推荐朋友们-IEEE1394 relevant, the portal is the first choice for 1394! Strongly recommend friends to s
- 2022-05-24 06:56:38下载
- 积分:1
-
可以进行动态重建的酒店平面图的源码下载,欢迎改进。
可以进行动态重建的酒店平面图的源码下载,欢迎改进。-Dynamic reconstruction can
- 2022-07-14 12:38:58下载
- 积分:1
-
GPU based saliency map generation and selective rendering paper.
GPU based saliency map generation and selective rendering paper.
- 2023-03-18 07:05:04下载
- 积分:1
-
描述铰链四杆机构运动设计的运动的运动几何方程
描述铰链四杆机构运动设计的运动的运动几何方程-Description of four-bar linkage design exercise exercise exercise of the geometric equation
- 2022-03-21 20:02:25下载
- 积分:1
-
现代先进微处理器有非常高的集成度和复杂度,又有寄存器堆、Cache等嵌入式部件,而且芯片管脚数相对较少,必须要有一定的自测试设计和其它的可测试性设计来简化测试代...
现代先进微处理器有非常高的集成度和复杂度,又有寄存器堆、Cache等嵌入式部件,而且芯片管脚数相对较少,必须要有一定的自测试设计和其它的可测试性设计来简化测试代码,提高故障覆盖率。本文简要讨论NRS4000微处理器芯片的以边界扫描测试为主体,以自测试为补充的可测试性设计框架。着重介绍芯片的边界扫描设计和芯片中译码控制器PLA和微程序ROM以及采用内嵌RAM结构的指令Cache和寄存器堆的内建自测试设计。仿真结果表明,这些可测试性设计大大缩短了测试代码的长度。-modern microprocessors have a very high degree of integration and complexity, there Register pile, Cache such as embedded components, but Chip few relatively small, There must be the self-test design and testing of other design code to simplify testing, fault coverage. This paper briefly discussed Key words microprocessor chip to the boundary-scan test as the mainstay, Since the test to add to the test design framework. Highlighting the boundary-scan chip design and chip decoder PLA and micro-controller procedures and the use of embedded ROM RA M structure of the instruction cache and register stack of built-in self-test design. The simulation results show that these tests can greatly shorten the design of the test code length.
- 2022-04-01 18:08:40下载
- 积分:1